Publications
Electron tomography
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L. Nicolai, K. Biermann, A. Trampert
Ultramicroscopy, 224, 113261, (2021)
Application of electron tomography for comprehensive determination of III-V interface properties
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M. Niehle, J. B. Rodriguez, L. Cerutti, E. Tournié, A. Trampert
Rapid Research Letter, 13, Issue 10, 1900290, (2019)
The Interaction of Extended Defects as the Origin of Step Bunching in Epitaxial III–V Layers on Vicinal Si(001) Substrates
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L. Nicolai, Ž. Gačević, E. Calleja, A. Trampert
Nanoscale Research Letters, 14, (2019)
Electron Tomography of Pencil-Shaped GaN/(In,Ga)N Core-Shell nanowires
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M. Niehle, J.-B. Rodriguez, L. Cerutti, E. Tournié, A. Trampert
Acta Materialia, 143, S. 121-129, (2018)
On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive
transmission electron tomography and microscopy study
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M. Niehle, A. Trampert, J.B. Rodriguez, L. Cerutti, E. Tournié
Scripta Materialia, 132, S. 5-8, (2017)
Electron tomography on III-Sb heterostructures on vicinal Si(001) substrates:
Anti-phase boundaries as a sink for threading dislocations
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M. Niehle, A. Trampert
Micron, 73, S. 54-62, (2015)
Electron tomography on nanopores embedded in epitaxial GaSb thin films
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M. Niehle, A. Trampert, S. Albert, A. Bengoechea-Encabo, E. Calleja
APL Materials 3, 3, 036102, (2015)
Electron tomography of (In,Ga)N insertions in GaN nanocolumns grown on semi-polar (112-2) GaN templates
In-situ electron microscopy
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M. Terker, L. Nicolai, S. Gaucher, J. Herfort, A. Trampert
Jorunal of Physical Chemistry C, 125, Issue 4, S. 2779–2784, (2021)
In situ transmission electron microscopy of disorder-order transition in epitaxially stabilized FeGe2
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M. Terker, B. Jenichen, J. Herfort, A. Trampert
Semiconductor Science and Technology, 34, Number 12, (2019)
In situ transmission electron microscopy of solid phase epitaxy of Ge on Fe3Si
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K. Berlin, A. Trampert
Journal of Physical Chemistry C, 122, Issue 5, S. 2968-2974, (2018)
Phase Stability and Anisotropic Sublimation of Cubic Ge–Sb–Te Alloy Observed by In Situ Transmission Electron Microscopy
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K. Berlin, A. Trampert
Ultramicroscopy, 178, S. 27-32, (2017)
Liquid-Solid phase transition of Ge-Sb-Te alloy observed by in-situ transmission electron microscopy
Other
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K. Tetzner, E. B. Treidel, O. Hilt, A. popp, S. B. Anooz, G. Wagner, A. Thies, K. Ickert,
H. Gargouri, J. Würfl
IEEE Electronic Device Letters, 40, Issue 9, (2019)
Lateral 1.8 kV Ga2O3 Metal-Insulator-Semiconductor Field Effect Transistor with Record Power Performance
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M. Azadmand, T. Auzelle, J. Lähnemann, Guanhui Gao, L. Nicolai , M. Ramsteiner, A. Trampert ,
S. Sanguinetti, O. Brandt, L. Geelhaar
Rapid Research Letter, 14, Issue 3, 1900615 (2019)
Self‐Assembly of Well‐Separated AlN Nanowires Directly on Sputtered Metallic TiN Films
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A. Fernando-saavedra, s. Alberta, A. Bengoechea-Encabo, D. Lopez-Romero, M. Niehle, s. Metzner, G. schmiedt,
F. Bertram, M. A. Sánchez-García, A. Trampert, J. Christen, E. calleja
Journal of Crystal Growth, 525, (2019)
Ordered arrays of defect-free GaN nanocolumns with very narrow excitonic emission line width