Electronmicroscopes

JEOL ARM 200 F

Analytical high-resolution transmission electron microscope with cs-correction.

Accelerating voltage 60, 80 & 200 kV
Electron source cold field emission
Resolution TEM information limit: 0,10 nm
TEM point resolution: 0,19 nm
STEM: 0,08nm
Magnification TEM mode: 50x to 2,000,000x
STEM mode: 200x to 15,000,000x
Holder sample holder with retainer system
stabilized be-double-tilt holder
Fischione Model 2050 tomography holder
Mel-Build double tilt tomography holder
In-situ holder DENSsolution lightning
Camera Gatan OneView (4k x 4k) CMOS camera
DigitalMicrograph
Detector Energy-dispersive X-ray detector Jeol EDX Centurio
Thermo Fisher Scientific Pathfinder microanalysis system
Corrector UHR STEM Cs-corrector Ascor

JEOL JEM-2100F

Analytical transmission electron microscope

Accelerating voltage 80, 160 & 200 kV
Electron source ZrO/W(100) Schottky Emitter
Resolution TEM information limit: 0,10 nm
TEM point resolution: 0,19 nm
STEM: 0,14 nm
Magnification TEM mode: 2,000x bis 1,500,000x
STEM mode: 200x bis 15,000,000x
Holder Jeol single tilt and Be double tilt analytical holder
Jeol Fe double tilt holder
Tomography holder
In-Situ TEM heating holder from Gatan
In-situ holder DENSsolution Lightning
Camera Gatan UltraScan 4000 (4k x 4k) CCD-Camera
DigitalMicrograph
Detector Jeol EDS-System JED-2300

Funding

The "Application Laboratory Electron Tomography" is funded by the European Regional Development Fund (ERDF) of the European Union and by the State of Berlin (Project No. 2016011843).


Contact

Dr. Achim Trampert Foto
  • Dr. Achim Trampert
  • trampert@pdi-berlin.de
  • +49 (0)30 20377-280
  • Room 615
  • Hausvogteiplatz 5 - 7
    10117 Berlin
    Germany
  • Head of project

Links

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